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1 Ergebnisse
1
Investigation of Electrical Characteristics and Trapping Ef..:
Feng, Zixuan
;
Feng, Shiwei
;
Pan, Shijie
...
IEEE Transactions on Electron Devices. 71 (2024) 8 - p. 4543-4548 , 2024
Link:
https://doi.org/10.1109/ted.2024.3412869
RT Journal T1 <Title>Investigation of Electrical Characteristics and Trapping Effects in p-GaN Gate HEMTs Under Electron Irradiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3412869&Exemplar=1&LAN=DE A1 Feng, Zixuan A1 Feng, Shiwei A1 Pan, Shijie A1 Li, Xuan A1 You, Binyu A1 Zhang, Boyang A1 Wang, Yaning A1 Zhang, Yamin A1 Zheng, Xiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 8 SP 4543 OP 4548 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3412869 DO https://doi.org/10.1109/ted.2024.3412869 SF ELIB - SuUB Bremen
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