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1 Ergebnisse
1
Investigation on Electrical Performance Degradation Mechani..:
Yue, Shaozhong
;
Zheng, Xuefeng
;
Zhang, Fang
...
IEEE Transactions on Electron Devices. 71 (2024) 8 - p. 4584-4589 , 2024
Link:
https://doi.org/10.1109/ted.2024.3418723
RT Journal T1 <Title>Investigation on Electrical Performance Degradation Mechanism of β-Ga₂O₃ Schottky Barrier Diodes Under 3 MeV Proton Radiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3418723&Exemplar=1&LAN=DE A1 Yue, Shaozhong A1 Zheng, Xuefeng A1 Zhang, Fang A1 Hong, Yuehua A1 Wang, Yingzhe A1 Zhu, Tian A1 Gong, Sunyan A1 Wang, Xiaohu A1 Lv, Ling A1 Cao, Yanrong A1 Zhang, Weidong A1 Zhang, Jianfu A1 Ma, Xiaohua A1 Hao, Yue PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 8 SP 4584 OP 4589 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3418723 DO https://doi.org/10.1109/ted.2024.3418723 SF ELIB - SuUB Bremen
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