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Understanding the Memory Window of Ferroelectric FET and De..:
Qin, Yixin
;
Zhao, Zijian
;
Lim, Suhwan
...
IEEE Transactions on Electron Devices. 71 (2024) 8 - p. 4655-4663 , 2024
Link:
https://doi.org/10.1109/ted.2024.3418942
RT Journal T1 <Title>Understanding the Memory Window of Ferroelectric FET and Demonstration of 4.8-V Memory Window With 20-nm HfO2</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3418942&Exemplar=1&LAN=DE A1 Qin, Yixin A1 Zhao, Zijian A1 Lim, Suhwan A1 Kim, Kijoon A1 Kim, Kwangsoo A1 Kim, Wanki A1 Ha, Daewon A1 Narayanan, Vijaykrishnan A1 Ni, Kai PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 8 SP 4655 OP 4663 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3418942 DO https://doi.org/10.1109/ted.2024.3418942 SF ELIB - SuUB Bremen
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