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Knowledge Network Embeddedness and Innovation Resilience:
Luo, Taiye
;
Qu, Juanjuan
;
Cheng, Shuo
IEEE Transactions on Engineering Management. 71 (2024) - p. 11454-11462 , 2024
Link:
https://doi.org/10.1109/tem.2024.3422106
RT Journal T1 <Title>Knowledge Network Embeddedness and Innovation Resilience</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tem.2024.3422106&Exemplar=1&LAN=DE A1 Luo, Taiye A1 Qu, Juanjuan A1 Cheng, Shuo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9391 SN 1558-0040 JF IEEE Transactions on Engineering Management VO 71 SP 11454 OP 11462 LK http://dx.doi.org/https://doi.org/10.1109/tem.2024.3422106 DO https://doi.org/10.1109/tem.2024.3422106 SF ELIB - SuUB Bremen
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