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1 Ergebnisse
1
Microwave Holography for EMI Source Imaging:
Yan, Xin
;
Li, Jiangshuai
;
Zhang, Wei
...
IEEE Transactions on Electromagnetic Compatibility. 66 (2024) 2 - p. 557-565 , 2024
Link:
https://doi.org/10.1109/temc.2023.3340233
RT Journal T1 <Title>Microwave Holography for EMI Source Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_temc.2023.3340233&Exemplar=1&LAN=DE A1 Yan, Xin A1 Li, Jiangshuai A1 Zhang, Wei A1 Ghosh, Kaustav A1 Sochoux, Philippe A1 Beetner, Daryl G. A1 Khilkevich, Victor PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9375 SN 1558-187X JF IEEE Transactions on Electromagnetic Compatibility VO 66 IS 2 SP 557 OP 565 LK http://dx.doi.org/https://doi.org/10.1109/temc.2023.3340233 DO https://doi.org/10.1109/temc.2023.3340233 SF ELIB - SuUB Bremen
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