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1 Ergebnisse
1
High-Temperature Failure Mechanism and Lifetime Assessment ..:
Wang, Wei
;
Gong, Yanfeng
;
Ren, Hanwen
..
IEEE Transactions on Industry Applications. 60 (2024) 1 - p. 1298-1309 , 2024
Link:
https://doi.org/10.1109/tia.2023.3307659
RT Journal T1 <Title>High-Temperature Failure Mechanism and Lifetime Assessment of Silicone Gel Package Insulation for High-Power Electronic Devices Based on Pyrolysis Kinetics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tia.2023.3307659&Exemplar=1&LAN=DE A1 Wang, Wei A1 Gong, Yanfeng A1 Ren, Hanwen A1 Wang, Jian A1 Li, Qingmin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0093-9994 SN 1939-9367 JF IEEE Transactions on Industry Applications VO 60 IS 1 SP 1298 OP 1309 LK http://dx.doi.org/https://doi.org/10.1109/tia.2023.3307659 DO https://doi.org/10.1109/tia.2023.3307659 SF ELIB - SuUB Bremen
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