I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Morphing Attack Detection-Database, Evaluation Platform, an..:
Raja, Kiran
;
Ferrara, Matteo
;
Franco, Annalisa
...
IEEE Transactions on Information Forensics and Security. 16 (2021) - p. 4336-4351 , 2021
Link:
https://doi.org/10.1109/tifs.2020.3035252
RT Journal T1
Morphing Attack Detection-Database, Evaluation Platform, and Benchmarking
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tifs.2020.3035252&Exemplar=1&LAN=DE A1 Raja, Kiran A1 Ferrara, Matteo A1 Franco, Annalisa A1 Spreeuwers, Luuk A1 Batskos, Ilias A1 de Wit, Florens A1 Gomez-Barrero, Marta A1 Scherhag, Ulrich A1 Fischer, Daniel A1 Venkatesh, Sushma Krupa A1 Singh, Jag Mohan A1 Li, Guoqiang A1 Bergeron, Loic A1 Isadskiy, Sergey A1 Ramachandra, Raghavendra A1 Rathgeb, Christian A1 Frings, Dinusha A1 Seidel, Uwe A1 Knopjes, Fons A1 Veldhuis, Raymond A1 Maltoni, Davide A1 Busch, Christoph PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 1556-6013 SN 1556-6021 JF IEEE Transactions on Information Forensics and Security VO 16 SP 4336 OP 4351 LK http://dx.doi.org/https://doi.org/10.1109/tifs.2020.3035252 DO https://doi.org/10.1109/tifs.2020.3035252 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)