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1 Ergebnisse
1
Improving Transferability of Adversarial Samples via Critic..:
Li, Zhiwei
;
Ren, Min
;
Li, Qi
..
IEEE Transactions on Information Forensics and Security. 19 (2024) - p. 6650-6664 , 2024
Link:
https://doi.org/10.1109/tifs.2024.3404857
RT Journal T1 <Title>Improving Transferability of Adversarial Samples via Critical Region-Oriented Feature-Level Attack</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tifs.2024.3404857&Exemplar=1&LAN=DE A1 Li, Zhiwei A1 Ren, Min A1 Li, Qi A1 Jiang, Fangling A1 Sun, Zhenan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1556-6013 SN 1556-6021 JF IEEE Transactions on Information Forensics and Security VO 19 SP 6650 OP 6664 LK http://dx.doi.org/https://doi.org/10.1109/tifs.2024.3404857 DO https://doi.org/10.1109/tifs.2024.3404857 SF ELIB - SuUB Bremen
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