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1 Ergebnisse
1
Unseen-Material Few-Shot Defect Segmentation With Optimal B..:
Shan, Dexing
;
Zhang, Yunzhou
;
Coleman, Sonya
...
IEEE Transactions on Industrial Informatics. 19 (2023) 7 - p. 8072-8082 , 2023
Link:
https://doi.org/10.1109/tii.2022.3216900
RT Journal T1 <Title>Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2022.3216900&Exemplar=1&LAN=DE A1 Shan, Dexing A1 Zhang, Yunzhou A1 Coleman, Sonya A1 Kerr, Dermot A1 Liu, Shitong A1 Hu, Ziqiang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 19 IS 7 SP 8072 OP 8082 LK http://dx.doi.org/https://doi.org/10.1109/tii.2022.3216900 DO https://doi.org/10.1109/tii.2022.3216900 SF ELIB - SuUB Bremen
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