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1 Ergebnisse
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Predicting Device Anomalous Condition in a Collaborated Ind..:
Alvi, Unaiza
;
Malik, Asad Waqar
;
Rahman, Anis Ur
..
IEEE Transactions on Industrial Informatics. 20 (2024) 1 - p. 390-398 , 2024
Link:
https://doi.org/10.1109/tii.2023.3262815
RT Journal T1 <Title>Predicting Device Anomalous Condition in a Collaborated Industrial Environment</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3262815&Exemplar=1&LAN=DE A1 Alvi, Unaiza A1 Malik, Asad Waqar A1 Rahman, Anis Ur A1 Khattak, Muazzam A. Khan A1 Khan, Samee U. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 1 SP 390 OP 398 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3262815 DO https://doi.org/10.1109/tii.2023.3262815 SF ELIB - SuUB Bremen
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