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1 Ergebnisse
1
Induced Current Thermo-Electrical Impedance Tomography for ..:
Zhang, Xu
;
Bai, Libing
;
Zhang, Jie
...
IEEE Transactions on Industrial Informatics. 20 (2024) 2 - p. 1862-1870 , 2024
Link:
https://doi.org/10.1109/tii.2023.3282312
RT Journal T1 <Title>Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3282312&Exemplar=1&LAN=DE A1 Zhang, Xu A1 Bai, Libing A1 Zhang, Jie A1 Liang, Yiping A1 Cheng, Yuhua A1 Tian, Lulu A1 Duan, Yong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 2 SP 1862 OP 1870 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3282312 DO https://doi.org/10.1109/tii.2023.3282312 SF ELIB - SuUB Bremen
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