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1 Ergebnisse
1
Feature Selection With Partial Autoencoding for Zero-Sample..:
Natsumeda, Masanao
;
Yairi, Takehisa
IEEE Transactions on Industrial Informatics. 20 (2024) 2 - p. 2144-2153 , 2024
Link:
https://doi.org/10.1109/tii.2023.3286882
RT Journal T1 <Title>Feature Selection With Partial Autoencoding for Zero-Sample Fault Diagnosis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3286882&Exemplar=1&LAN=DE A1 Natsumeda, Masanao A1 Yairi, Takehisa PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 2 SP 2144 OP 2153 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3286882 DO https://doi.org/10.1109/tii.2023.3286882 SF ELIB - SuUB Bremen
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