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1 Ergebnisse
1
Enhanced Diffusion-Based Analysis for Fast Defect Detection..:
Liang, Yiping
;
Bai, Libing
;
Tian, Lulu
...
IEEE Transactions on Industrial Informatics. 20 (2024) 2 - p. 2884-2896 , 2024
Link:
https://doi.org/10.1109/tii.2023.3298469
RT Journal T1 <Title>Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3298469&Exemplar=1&LAN=DE A1 Liang, Yiping A1 Bai, Libing A1 Tian, Lulu A1 Zhang, Xu A1 Ren, Chao A1 Shao, Dan A1 Ma, Zhenzhong A1 Sun, Mosi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 2 SP 2884 OP 2896 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3298469 DO https://doi.org/10.1109/tii.2023.3298469 SF ELIB - SuUB Bremen
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