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1 Ergebnisse
1
Statistical Modeling and Reliability Analysis for Degradati..:
Zhai, Qingqing
;
Xu, Ancha
;
Yang, Jun
.
IEEE Transactions on Industrial Informatics. 20 (2024) 3 - p. 3675-3684 , 2024
Link:
https://doi.org/10.1109/tii.2023.3313668
RT Journal T1 <Title>Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3313668&Exemplar=1&LAN=DE A1 Zhai, Qingqing A1 Xu, Ancha A1 Yang, Jun A1 Zhou, Yijing PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 3 SP 3675 OP 3684 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3313668 DO https://doi.org/10.1109/tii.2023.3313668 SF ELIB - SuUB Bremen
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