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1 Ergebnisse
1
An End-to-End Bilateral Network for Multidefect Detection o..:
Guo, Feng
;
Chen, Zhongshu
;
Hu, Jian
...
IEEE Transactions on Industrial Informatics. 20 (2024) 6 - p. 8347-8357 , 2024
Link:
https://doi.org/10.1109/tii.2023.3342886
RT Journal T1 <Title>An End-to-End Bilateral Network for Multidefect Detection of Solid Propellants</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2023.3342886&Exemplar=1&LAN=DE A1 Guo, Feng A1 Chen, Zhongshu A1 Hu, Jian A1 Zuo, Lin A1 Xiahou, Tangfan A1 Liu, Yu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 6 SP 8347 OP 8357 LK http://dx.doi.org/https://doi.org/10.1109/tii.2023.3342886 DO https://doi.org/10.1109/tii.2023.3342886 SF ELIB - SuUB Bremen
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