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1 Ergebnisse
1
Data-Driven Fault Diagnosis of Internal Short Circuit for S..:
Qiao, Dongdong
;
Wei, Xuezhe
;
Jiang, Bo
...
IEEE Transactions on Industrial Informatics. 20 (2024) 4 - p. 6751-6761 , 2024
Link:
https://doi.org/10.1109/tii.2024.3353872
RT Journal T1
Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected Battery Packs Using Partial Voltage Curves
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2024.3353872&Exemplar=1&LAN=DE A1 Qiao, Dongdong A1 Wei, Xuezhe A1 Jiang, Bo A1 Fan, Wenjun A1 Gong, Hui A1 Lai, Xin A1 Zheng, Yuejiu A1 Dai, Haifeng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 4 SP 6751 OP 6761 LK http://dx.doi.org/https://doi.org/10.1109/tii.2024.3353872 DO https://doi.org/10.1109/tii.2024.3353872 SF ELIB - SuUB Bremen
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