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A Quality-Relevant Fault Diagnosis Scheme Aided by Enhanced..:
Sun, Cheng-Yuan
;
Yang, Guang-Hong
IEEE Transactions on Industrial Informatics. 20 (2024) 5 - p. 7471-7480 , 2024
Link:
https://doi.org/10.1109/tii.2024.3361024
RT Journal T1 <Title>A Quality-Relevant Fault Diagnosis Scheme Aided by Enhanced Dynamic Just-in-Time Learning for Nonlinear Industrial Systems</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2024.3361024&Exemplar=1&LAN=DE A1 Sun, Cheng-Yuan A1 Yang, Guang-Hong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 5 SP 7471 OP 7480 LK http://dx.doi.org/https://doi.org/10.1109/tii.2024.3361024 DO https://doi.org/10.1109/tii.2024.3361024 SF ELIB - SuUB Bremen
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