I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

A Novel Chip-on-Board Defect Detection Approach Combining I..:

Jiang, Ye ; Liu, Zhiyong ; Liao, Guanglan.
IEEE Transactions on Industrial Informatics.  20 (2024)  5 - p. 8044-8054 , 2024
Link: https://doi.org/10.1109/tii.2024.3366251