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1 Ergebnisse
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A Hybrid Deep Learning-Based Framework for Chip Packaging F..:
Wang, Jie
;
Li, Gaomin
;
Bai, Haoyu
...
IEEE Transactions on Industrial Informatics. 20 (2024) 9 - p. 11181-11191 , 2024
Link:
https://doi.org/10.1109/tii.2024.3397360
RT Journal T1 <Title>A Hybrid Deep Learning-Based Framework for Chip Packaging Fault Diagnostics in X-Ray Images</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tii.2024.3397360&Exemplar=1&LAN=DE A1 Wang, Jie A1 Li, Gaomin A1 Bai, Haoyu A1 Yuan, Guixin A1 Li, Xuan A1 Lin, Bin A1 Zhong, Lijun A1 Zhang, Xiaohu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1551-3203 SN 1941-0050 JF IEEE Transactions on Industrial Informatics VO 20 IS 9 SP 11181 OP 11191 LK http://dx.doi.org/https://doi.org/10.1109/tii.2024.3397360 DO https://doi.org/10.1109/tii.2024.3397360 SF ELIB - SuUB Bremen
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