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Characterization of RFID Strap Using Single-Ended Probe:
Sung-Lin Chen
;
Ken-Huang Lin
IEEE Transactions on Instrumentation and Measurement. 58 (2009) 10 - p. 3619-3626 , 2009
Link:
https://doi.org/10.1109/tim.2009.2018697
RT Journal T1 <Title>Characterization of RFID Strap Using Single-Ended Probe</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2009.2018697&Exemplar=1&LAN=DE A1 Sung-Lin Chen A1 Ken-Huang Lin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2009 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 58 IS 10 SP 3619 OP 3626 LK http://dx.doi.org/https://doi.org/10.1109/tim.2009.2018697 DO https://doi.org/10.1109/tim.2009.2018697 SF ELIB - SuUB Bremen
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