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Bayesian-Inference-Based Voltage Dip State Estimation:
Ye, Gu
;
Xiang, Yu
;
Nijhuis, Michiel
..
IEEE Transactions on Instrumentation and Measurement. 66 (2017) 11 - p. 2977-2987 , 2017
Link:
https://doi.org/10.1109/tim.2017.2734138
RT Journal T1 <Title>Bayesian-Inference-Based Voltage Dip State Estimation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2017.2734138&Exemplar=1&LAN=DE A1 Ye, Gu A1 Xiang, Yu A1 Nijhuis, Michiel A1 Cuk, Vladimir A1 Cobben, J. F. G. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2017 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 66 IS 11 SP 2977 OP 2987 LK http://dx.doi.org/https://doi.org/10.1109/tim.2017.2734138 DO https://doi.org/10.1109/tim.2017.2734138 SF ELIB - SuUB Bremen
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