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1 Ergebnisse
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Investigating Stability of Si Sphere Surface Layer in Ambie..:
Fujita, Kazuaki
;
Fujii, Kenichi
;
Zhang, Lulu
...
IEEE Transactions on Instrumentation and Measurement. 71 (2022) - p. 1-9 , 2022
Link:
https://doi.org/10.1109/tim.2021.3129229
RT Journal T1
Investigating Stability of Si Sphere Surface Layer in Ambient–Vacuum Cyclic Measurements Using Ellipsometry
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2021.3129229&Exemplar=1&LAN=DE A1 Fujita, Kazuaki A1 Fujii, Kenichi A1 Zhang, Lulu A1 Azuma, Yasushi A1 Mizushima, Shigeki A1 Kuramoto, Naoki PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 71 SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/tim.2021.3129229 DO https://doi.org/10.1109/tim.2021.3129229 SF ELIB - SuUB Bremen
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