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1 Ergebnisse
1
Deep Learning for Unsupervised Anomaly Localization in Indu..:
Tao, Xian
;
Gong, Xinyi
;
Zhang, Xin
..
IEEE Transactions on Instrumentation and Measurement. 71 (2022) - p. 1-21 , 2022
Link:
https://doi.org/10.1109/tim.2022.3196436
RT Journal T1 <Title>Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2022.3196436&Exemplar=1&LAN=DE A1 Tao, Xian A1 Gong, Xinyi A1 Zhang, Xin A1 Yan, Shaohua A1 Adak, Chandranath PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 71 SP 1 OP 21 LK http://dx.doi.org/https://doi.org/10.1109/tim.2022.3196436 DO https://doi.org/10.1109/tim.2022.3196436 SF ELIB - SuUB Bremen
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