I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Intelligent Seam Tracking of an Ultranarrow Gap During K-TI..:

Lin, Ziluo ; Shi, Yonghua ; Wang, Zishun..
IEEE Transactions on Instrumentation and Measurement.  72 (2023)  - p. 1-14 , 2023
Link: https://doi.org/10.1109/tim.2022.3230475