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1 Ergebnisse
1
Robust Ellipsoid Fitting Using Combination of Axial and Sam..:
Han, Min
;
Kan, Jiangming
;
Yang, Gongping
.
IEEE Transactions on Instrumentation and Measurement. 72 (2023) - p. 1-14 , 2023
Link:
https://doi.org/10.1109/tim.2023.3315361
RT Journal T1 <Title>Robust Ellipsoid Fitting Using Combination of Axial and Sampson Distances</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2023.3315361&Exemplar=1&LAN=DE A1 Han, Min A1 Kan, Jiangming A1 Yang, Gongping A1 Li, Xinghui PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 72 SP 1 OP 14 LK http://dx.doi.org/https://doi.org/10.1109/tim.2023.3315361 DO https://doi.org/10.1109/tim.2023.3315361 SF ELIB - SuUB Bremen
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