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1 Ergebnisse
1
Curves-Based Similarity Method (CBSM) for Defect Depth Quan..:
Yang, Pengbin
;
Zhou, Xiuyun
;
He, Ruijie
.
IEEE Transactions on Instrumentation and Measurement. 72 (2023) - p. 1-9 , 2023
Link:
https://doi.org/10.1109/tim.2023.3323993
RT Journal T1
Curves-Based Similarity Method (CBSM) for Defect Depth Quantization
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2023.3323993&Exemplar=1&LAN=DE A1 Yang, Pengbin A1 Zhou, Xiuyun A1 He, Ruijie A1 Liu, Zhen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 72 SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/tim.2023.3323993 DO https://doi.org/10.1109/tim.2023.3323993 SF ELIB - SuUB Bremen
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