I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
An Incremental Knowledge Learning Framework for Continuous ..:
Sun, Chen
;
Gao, Liang
;
Li, Xinyu
..
IEEE Transactions on Instrumentation and Measurement. 73 (2024) - p. 1-11 , 2024
Link:
https://doi.org/10.1109/tim.2023.3343768
RT Journal T1 <Title>An Incremental Knowledge Learning Framework for Continuous Defect Detection</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2023.3343768&Exemplar=1&LAN=DE A1 Sun, Chen A1 Gao, Liang A1 Li, Xinyu A1 Zheng, Pai A1 Gao, Yiping PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 73 SP 1 OP 11 LK http://dx.doi.org/https://doi.org/10.1109/tim.2023.3343768 DO https://doi.org/10.1109/tim.2023.3343768 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
