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Fast Adaptive Coarse-to-Fine PatchMatch-Based Defect Detect..:

Shi, Chenbo ; Jia, Baodun ; Zhang, Chun...
IEEE Transactions on Instrumentation and Measurement.  73 (2024)  - p. 1-11 , 2024
Link: https://doi.org/10.1109/tim.2023.3343769