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1 Ergebnisse
1
Deep Feature Contrasting for Industrial Image Anomaly Segme..:
Wan, Qian
;
Cao, Yunkang
;
Gao, Liang
..
IEEE Transactions on Instrumentation and Measurement. 73 (2024) - p. 1-11 , 2024
Link:
https://doi.org/10.1109/tim.2023.3348901
RT Journal T1 <Title>Deep Feature Contrasting for Industrial Image Anomaly Segmentation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2023.3348901&Exemplar=1&LAN=DE A1 Wan, Qian A1 Cao, Yunkang A1 Gao, Liang A1 Li, Xinyu A1 Gao, Yiping PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 73 SP 1 OP 11 LK http://dx.doi.org/https://doi.org/10.1109/tim.2023.3348901 DO https://doi.org/10.1109/tim.2023.3348901 SF ELIB - SuUB Bremen
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