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1 Ergebnisse
1
A Lightweight Fine-Grained Perception Defect Inspection Net..:
Huang, Tao
;
Zhao, Liming
;
Zhang, Yabo
..
IEEE Transactions on Instrumentation and Measurement. 73 (2024) - p. 1-10 , 2024
Link:
https://doi.org/10.1109/tim.2024.3353264
RT Journal T1 <Title>A Lightweight Fine-Grained Perception Defect Inspection Network Under Multitask Learning on Highly Reflective Surface</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2024.3353264&Exemplar=1&LAN=DE A1 Huang, Tao A1 Zhao, Liming A1 Zhang, Yabo A1 Tian, Jican A1 Zhou, Wenlong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 73 SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/tim.2024.3353264 DO https://doi.org/10.1109/tim.2024.3353264 SF ELIB - SuUB Bremen
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