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1 Ergebnisse
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ProbSparse Attention-Based Fault Diagnosis for Industrial R..:
Wang, Yimo
;
He, Yiming
;
Kang, Bin
..
IEEE Transactions on Instrumentation and Measurement. 73 (2024) - p. 1-12 , 2024
Link:
https://doi.org/10.1109/tim.2024.3374323
RT Journal T1 <Title>ProbSparse Attention-Based Fault Diagnosis for Industrial Robots Under Different Working Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2024.3374323&Exemplar=1&LAN=DE A1 Wang, Yimo A1 He, Yiming A1 Kang, Bin A1 Liu, Jian A1 Sun, Changyin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 73 SP 1 OP 12 LK http://dx.doi.org/https://doi.org/10.1109/tim.2024.3374323 DO https://doi.org/10.1109/tim.2024.3374323 SF ELIB - SuUB Bremen
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