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1 Ergebnisse
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Patch Matching for Few-Shot Industrial Defect Detection:
Chen, Ruiyun
;
Yu, Guitao
;
Qin, Zhen
...
IEEE Transactions on Instrumentation and Measurement. 73 (2024) - p. 1-11 , 2024
Link:
https://doi.org/10.1109/tim.2024.3413170
RT Journal T1 <Title>Patch Matching for Few-Shot Industrial Defect Detection</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tim.2024.3413170&Exemplar=1&LAN=DE A1 Chen, Ruiyun A1 Yu, Guitao A1 Qin, Zhen A1 Song, Kangkang A1 Tu, Jianfei A1 Jiang, Xianliang A1 Liang, Dan A1 Peng, Chengbin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9456 SN 1557-9662 JF IEEE Transactions on Instrumentation and Measurement VO 73 SP 1 OP 11 LK http://dx.doi.org/https://doi.org/10.1109/tim.2024.3413170 DO https://doi.org/10.1109/tim.2024.3413170 SF ELIB - SuUB Bremen
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