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1 Ergebnisse
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Robust Bidirectional Poly-Matching:
Lee, Ween Jiann
;
Tkachenko, Maksim
;
Lauw, Hady W.
IEEE Transactions on Knowledge and Data Engineering. 35 (2023) 10 - p. 10762-10774 , 2023
Link:
https://doi.org/10.1109/tkde.2023.3266480
RT Journal T1 <Title>Robust Bidirectional Poly-Matching</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tkde.2023.3266480&Exemplar=1&LAN=DE A1 Lee, Ween Jiann A1 Tkachenko, Maksim A1 Lauw, Hady W. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1041-4347 SN 1558-2191 SN 2326-3865 JF IEEE Transactions on Knowledge and Data Engineering VO 35 IS 10 SP 10762 OP 10774 LK http://dx.doi.org/https://doi.org/10.1109/tkde.2023.3266480 DO https://doi.org/10.1109/tkde.2023.3266480 SF ELIB - SuUB Bremen
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