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Silicon Micromachined Waveguide Calibration Standards for T..:
Campion, James
;
Oberhammer, Joachim
IEEE Transactions on Microwave Theory and Techniques. 69 (2021) 8 - p. 3927-3942 , 2021
Link:
https://doi.org/10.1109/tmtt.2021.3091720
RT Journal T1 <Title>Silicon Micromachined Waveguide Calibration Standards for Terahertz Metrology</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tmtt.2021.3091720&Exemplar=1&LAN=DE A1 Campion, James A1 Oberhammer, Joachim PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9480 SN 1557-9670 JF IEEE Transactions on Microwave Theory and Techniques VO 69 IS 8 SP 3927 OP 3942 LK http://dx.doi.org/https://doi.org/10.1109/tmtt.2021.3091720 DO https://doi.org/10.1109/tmtt.2021.3091720 SF ELIB - SuUB Bremen
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