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Analysis and Application of a Surface Admittance Operator f..:
Bosman, Dries
;
Huynen, Martijn
;
De Zutter, Daniël
...
IEEE Transactions on Microwave Theory and Techniques. 71 (2023) 7 - p. 2794-2806 , 2023
Link:
https://doi.org/10.1109/tmtt.2023.3244205
RT Journal T1 <Title>Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tmtt.2023.3244205&Exemplar=1&LAN=DE A1 Bosman, Dries A1 Huynen, Martijn A1 De Zutter, Daniël A1 Sun, Xiao A1 Pantano, Nicolas A1 Van der Plas, Geert A1 Beyne, Eric A1 Vande Ginste, Dries PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9480 SN 1557-9670 JF IEEE Transactions on Microwave Theory and Techniques VO 71 IS 7 SP 2794 OP 2806 LK http://dx.doi.org/https://doi.org/10.1109/tmtt.2023.3244205 DO https://doi.org/10.1109/tmtt.2023.3244205 SF ELIB - SuUB Bremen
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