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1 Ergebnisse
1
Effect of Oxygen Treatment on the Electrical Performance an..:
Chen, Yi-Xuan
;
Wang, Yi-Lin
;
Li, Fu-Jyuan
...
IEEE Transactions on Nanotechnology. 23 (2024) - p. 299-302 , 2024
Link:
https://doi.org/10.1109/tnano.2024.3381478
RT Journal T1
Effect of Oxygen Treatment on the Electrical Performance and Reliability of IWO Thin-Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tnano.2024.3381478&Exemplar=1&LAN=DE A1 Chen, Yi-Xuan A1 Wang, Yi-Lin A1 Li, Fu-Jyuan A1 Chang, Shu-Jui A1 Lee, Tsung-En A1 Cheng, Chao-Ching A1 Lee, Meng-Chien A1 Li, Hui-Hsuan A1 Lin, Yu-Hsien A1 Chien, Chao-Hsin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1536-125X SN 1941-0085 JF IEEE Transactions on Nanotechnology VO 23 SP 299 OP 302 LK http://dx.doi.org/https://doi.org/10.1109/tnano.2024.3381478 DO https://doi.org/10.1109/tnano.2024.3381478 SF ELIB - SuUB Bremen
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