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1 Ergebnisse
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Total-Ionizing-Dose Response of MoS2Transistors With ZrO2an..:
Wang, Pan
;
Kalita, Hirokjyoti
;
Krishnaprasad, Adithi
...
IEEE Transactions on Nuclear Science. 66 (2019) 7 - p. 1584-1591 , 2019
Link:
https://doi.org/10.1109/tns.2018.2885751
RT Journal T1
Total-Ionizing-Dose Response of MoS2Transistors With ZrO2and h-BN Gate Dielectrics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2018.2885751&Exemplar=1&LAN=DE A1 Wang, Pan A1 Kalita, Hirokjyoti A1 Krishnaprasad, Adithi A1 Dev, Durjoy A1 O'Hara, Andrew A1 Jiang, Rong A1 Zhang, Enxia A1 Fleetwood, Daniel M. A1 Schrimpf, Ronald D. A1 Pantelides, Sokrates T. A1 Roy, Tania PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 66 IS 7 SP 1584 OP 1591 LK http://dx.doi.org/https://doi.org/10.1109/tns.2018.2885751 DO https://doi.org/10.1109/tns.2018.2885751 SF ELIB - SuUB Bremen
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