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1 Ergebnisse
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A Study on Ionization Damage Effects of Anode-Short MOS-Con..:
Li, Lei
;
Li, Ze-hong
;
Chen, Xiao-Chi
...
IEEE Transactions on Nuclear Science. 67 (2020) 9 - p. 2062-2072 , 2020
Link:
https://doi.org/10.1109/tns.2020.3012766
RT Journal T1 <Title>A Study on Ionization Damage Effects of Anode-Short MOS-Controlled Thyristor</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2020.3012766&Exemplar=1&LAN=DE A1 Li, Lei A1 Li, Ze-hong A1 Chen, Xiao-Chi A1 Wu, Yu-zhou A1 Zhang, Jin-ping A1 Ren, Min A1 Zhang, Bo A1 Pang, Yuan-long A1 Wu, Xiao-Li PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 67 IS 9 SP 2062 OP 2072 LK http://dx.doi.org/https://doi.org/10.1109/tns.2020.3012766 DO https://doi.org/10.1109/tns.2020.3012766 SF ELIB - SuUB Bremen
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