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Impact of Terrestrial Neutrons on the Reliability of SiC VD..:
Martinella, C.
;
Alia, R. G.
;
Stark, R.
...
IEEE Transactions on Nuclear Science. 68 (2021) 5 - p. 634-641 , 2021
Link:
https://doi.org/10.1109/tns.2021.3065122
RT Journal T1 <Title>Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2021.3065122&Exemplar=1&LAN=DE A1 Martinella, C. A1 Alia, R. G. A1 Stark, R. A1 Coronetti, A. A1 Cazzaniga, C. A1 Kastriotou, M. A1 Kadi, Y. A1 Gaillard, R. A1 Grossner, U. A1 Javanainen, A. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 68 IS 5 SP 634 OP 641 LK http://dx.doi.org/https://doi.org/10.1109/tns.2021.3065122 DO https://doi.org/10.1109/tns.2021.3065122 SF ELIB - SuUB Bremen
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