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1 Ergebnisse
1
Single Event Burnout Hardening of Enhancement Mode HEMTs Wi..:
Zhen, Zixin
;
Feng, Chun
;
Wang, Quan
...
IEEE Transactions on Nuclear Science. 68 (2021) 9 - p. 2358-2366 , 2021
Link:
https://doi.org/10.1109/tns.2021.3102980
RT Journal T1 <Title>Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2021.3102980&Exemplar=1&LAN=DE A1 Zhen, Zixin A1 Feng, Chun A1 Wang, Quan A1 Niu, Di A1 Wang, Xiaoliang A1 Tan, Manqing PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 68 IS 9 SP 2358 OP 2366 LK http://dx.doi.org/https://doi.org/10.1109/tns.2021.3102980 DO https://doi.org/10.1109/tns.2021.3102980 SF ELIB - SuUB Bremen
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