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1 Ergebnisse
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Characterization of Single-Event Upsets Induced by High-LET..:
Yaqing, Chi
;
Pengcheng, Huang
;
Qian, Sun
..
IEEE Transactions on Nuclear Science. 69 (2022) 5 - p. 1176-1181 , 2022
Link:
https://doi.org/10.1109/tns.2021.3127567
RT Journal T1 <Title>Characterization of Single-Event Upsets Induced by High-LET Heavy Ions in 16-nm Bulk FinFET SRAMs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2021.3127567&Exemplar=1&LAN=DE A1 Yaqing, Chi A1 Pengcheng, Huang A1 Qian, Sun A1 Bin, Liang A1 Zhenyu, Zhao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 5 SP 1176 OP 1181 LK http://dx.doi.org/https://doi.org/10.1109/tns.2021.3127567 DO https://doi.org/10.1109/tns.2021.3127567 SF ELIB - SuUB Bremen
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