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1 Ergebnisse
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Comparison of Total Ionizing Dose Effects in SOI FinFETs Be..:
Zhang, Xu
;
Liu, Fanyu
;
Li, Bo
...
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 359-366 , 2022
Link:
https://doi.org/10.1109/tns.2021.3129784
RT Journal T1 <Title>Comparison of Total Ionizing Dose Effects in SOI FinFETs Between Room and High Temperature</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2021.3129784&Exemplar=1&LAN=DE A1 Zhang, Xu A1 Liu, Fanyu A1 Li, Bo A1 Yang, Can A1 Huang, Yang A1 Lu, Peng A1 Chen, Siyuan A1 Cheng, Jinxing A1 Wang, Qingbo A1 Yu, Ai A1 Zhang, Tiexin A1 Zheng, Zhongshan A1 Zhang, Qingzhu A1 Yin, Huaxiang A1 Luo, Jiajun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 3 SP 359 OP 366 LK http://dx.doi.org/https://doi.org/10.1109/tns.2021.3129784 DO https://doi.org/10.1109/tns.2021.3129784 SF ELIB - SuUB Bremen
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