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1 Ergebnisse
1
Application of Total Ionizing Dose Radiation Test Standards..:
Yu, Qingkui
;
Ali, Waqas
;
Cao, Shuang
...
IEEE Transactions on Nuclear Science. 69 (2022) 5 - p. 1127-1133 , 2022
Link:
https://doi.org/10.1109/tns.2021.3135123
RT Journal T1 <Title>Application of Total Ionizing Dose Radiation Test Standards to SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2021.3135123&Exemplar=1&LAN=DE A1 Yu, Qingkui A1 Ali, Waqas A1 Cao, Shuang A1 Wang, He A1 Lv, He A1 Sun, Yi A1 Mo, Rigen A1 Wang, Qianyuan A1 Mei, Bo A1 Sun, Jiajia A1 Zhang, Hongwei A1 Tang, Min A1 Bai, Song A1 Zhang, Teng A1 Bai, Yun A1 Zhang, Chenrui PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 5 SP 1127 OP 1133 LK http://dx.doi.org/https://doi.org/10.1109/tns.2021.3135123 DO https://doi.org/10.1109/tns.2021.3135123 SF ELIB - SuUB Bremen
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