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1 Ergebnisse
1
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CM..:
Bonaldo, Stefano
;
Gorchichko, Mariia
;
Zhang, En Xia
...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1444-1452 , 2022
Link:
https://doi.org/10.1109/tns.2022.3142385
RT Journal T1
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2022.3142385&Exemplar=1&LAN=DE A1 Bonaldo, Stefano A1 Gorchichko, Mariia A1 Zhang, En Xia A1 Ma, Teng A1 Mattiazzo, Serena A1 Bagatin, Marta A1 Paccagnella, Alessandro A1 Gerardin, Simone A1 Schrimpf, Ronald D. A1 Reed, Robert A. A1 Linten, Dimitri A1 Mitard, Jerome A1 Fleetwood, Daniel M. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 7 SP 1444 OP 1452 LK http://dx.doi.org/https://doi.org/10.1109/tns.2022.3142385 DO https://doi.org/10.1109/tns.2022.3142385 SF ELIB - SuUB Bremen
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