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1 Ergebnisse
1
Negative-Bias-Stress and Total-Ionizing-Dose Effects in Dee..:
Rony, M. W.
;
Zhang, En Xia
;
Toguchi, Shintaro
...
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 299-306 , 2022
Link:
https://doi.org/10.1109/tns.2022.3144204
RT Journal T1
Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2022.3144204&Exemplar=1&LAN=DE A1 Rony, M. W. A1 Zhang, En Xia A1 Toguchi, Shintaro A1 Luo, Xuyi A1 Reaz, Mahmud A1 Li, Kan A1 Linten, Dimitri A1 Mitard, Jerome A1 Reed, Robert A. A1 Fleetwood, Daniel M. A1 Schrimpf, Ronald D. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 3 SP 299 OP 306 LK http://dx.doi.org/https://doi.org/10.1109/tns.2022.3144204 DO https://doi.org/10.1109/tns.2022.3144204 SF ELIB - SuUB Bremen
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