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1 Ergebnisse
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Total Ionizing Dose Radiation Effects Hardening Using Back-..:
Huang, Yang
;
Han, Zhengsheng
;
Liu, Fanyu
...
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 453-461 , 2022
Link:
https://doi.org/10.1109/tns.2022.3145027
RT Journal T1 <Title>Total Ionizing Dose Radiation Effects Hardening Using Back-Gate Bias in Double-SOI Structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2022.3145027&Exemplar=1&LAN=DE A1 Huang, Yang A1 Han, Zhengsheng A1 Liu, Fanyu A1 Li, Bo A1 Li, Binhong A1 Gao, Jiantou A1 Zhang, Gang A1 Wang, Lei A1 Li, Duoli A1 Jiao, Jian A1 Zhao, Fazhan A1 Ye, Tianchun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 3 SP 453 OP 461 LK http://dx.doi.org/https://doi.org/10.1109/tns.2022.3145027 DO https://doi.org/10.1109/tns.2022.3145027 SF ELIB - SuUB Bremen
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