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1 Ergebnisse
1
Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Sh..:
Watkins, A. C.
;
Vibbert, S. T.
;
D'Amico, J. V.
...
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 374-380 , 2022
Link:
https://doi.org/10.1109/tns.2022.3146318
RT Journal T1
Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2022.3146318&Exemplar=1&LAN=DE A1 Watkins, A. C. A1 Vibbert, S. T. A1 D'Amico, J. V. A1 Kauppila, J. S. A1 Haeffner, T. D. A1 Ball, D. R. A1 Zhang, E. X. A1 Warren, K. M. A1 Alles, M. L. A1 Massengill, L. W. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 3 SP 374 OP 380 LK http://dx.doi.org/https://doi.org/10.1109/tns.2022.3146318 DO https://doi.org/10.1109/tns.2022.3146318 SF ELIB - SuUB Bremen
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