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How the Analysis of Archival Data Could Provide Helpful Inf..:
Martin-Holgado, Pedro
;
Romero-Maestre, Amor
;
de-Martin-Hernandez, Jose
...
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1691-1699 , 2022
Link:
https://doi.org/10.1109/tns.2022.3185940
RT Journal T1 <Title>How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2022.3185940&Exemplar=1&LAN=DE A1 Martin-Holgado, Pedro A1 Romero-Maestre, Amor A1 de-Martin-Hernandez, Jose A1 Gonzalez-Lujan, Jose J. A1 Illera-Gomez, Ivan A1 Jimenez-de-Luna, Yolanda A1 Morilla, Fernando A1 Barbero, Mario Sacristan A1 Alia, Ruben Garcia A1 Dominguez, Manuel A1 Morilla, Yolanda PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 69 IS 7 SP 1691 OP 1699 LK http://dx.doi.org/https://doi.org/10.1109/tns.2022.3185940 DO https://doi.org/10.1109/tns.2022.3185940 SF ELIB - SuUB Bremen
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