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Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxid..:

Cadena, R. M. ; Ball, D. R. ; Zhang, E. X....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 363-369 , 2023
Link: https://doi.org/10.1109/tns.2023.3237979