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1 Ergebnisse
1
Low-Frequency Noise and Border Traps in Irradiated nMOS and..:
Li, Kan
;
Luo, Xuyi
;
Rony, M. W.
...
IEEE Transactions on Nuclear Science. 70 (2023) 4 - p. 442-448 , 2023
Link:
https://doi.org/10.1109/tns.2023.3239844
RT Journal T1
Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tns.2023.3239844&Exemplar=1&LAN=DE A1 Li, Kan A1 Luo, Xuyi A1 Rony, M. W. A1 Gorchichko, Mariia A1 Hiblot, Gaspard A1 Van Huylenbroeck, Stefaan A1 Jourdain, Anne A1 Alles, Michael L. A1 Reed, Robert A. A1 Zhang, En Xia A1 Fleetwood, Daniel M. A1 Schrimpf, Ronald D. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9499 SN 1558-1578 JF IEEE Transactions on Nuclear Science VO 70 IS 4 SP 442 OP 448 LK http://dx.doi.org/https://doi.org/10.1109/tns.2023.3239844 DO https://doi.org/10.1109/tns.2023.3239844 SF ELIB - SuUB Bremen
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